Thumbnail
Access Restriction
Subscribed

Author Magee, Jeff ♦ Kramer, Jeff ♦ Uchitel, Sebastian
Source ACM Digital Library
Content type Text
Publisher Association for Computing Machinery (ACM)
File Format PDF
Language English
Subject Domain (in DDC) Computer science, information & general works ♦ Data processing & computer science
Subject Keyword Negative scenarios ♦ Implied scenarios ♦ Msc
Abstract Scenario-based specifications such as Message Sequence Charts (MSCs) are popular for requirement elicitation and specification. MSCs describe two distinct aspects of a system: on the one hand they provide examples of intended system behaviour and on the other they outline the system architecture. A mismatch between architecture and behaviour may give rise to implied scenarios. Implied scenarios occur because a component's local view of the system state is insufficient to enforce specified system behaviour. An implied scenario indicates a gap in the MSC specification that needs to be clarified. It may simply mean that an acceptable scenario has been overlooked and should be added to the scenario specification. Alternatively, it may represent an unacceptable behaviour which should be documented and avoided in the final implementation. Thus implied scenarios can be used to iteratively drive requirements elicitation. However, in order to do so, tools for coping with rejected implied scenarios are needed. The contributions of this paper are twofold. Firstly, we define a language for describing negative scenarios. Secondly, we complement existing implied scenario detection methods with techniques for accommodating negative scenarios.
Description Affiliation: Imperial College, London, UK (Uchitel, Sebastian; Kramer, Jeff; Magee, Jeff)
Age Range 18 to 22 years ♦ above 22 year
Educational Use Research
Education Level UG and PG
Learning Resource Type Article
Publisher Date 1979-04-01
Publisher Place New York
Journal ACM SIGSOFT Software Engineering Notes (SOEN)
Volume Number 27
Issue Number 6
Page Count 10
Starting Page 109
Ending Page 118


Open content in new tab

   Open content in new tab
Source: ACM Digital Library