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Author Wong, J. ♦ Lytle, F. W.
Source United States Department of Energy Office of Scientific and Technical Information
Content type Text
Language English
Subject Keyword MATERIALS SCIENCE ♦ DIAMONDS ♦ IMPURITIES ♦ ABSORPTION ♦ CARBIDES ♦ CATALYSTS ♦ CRYSTAL GROWTH ♦ CRYSTAL STRUCTURE ♦ FINE STRUCTURE ♦ INTERFERENCE ♦ MELTING ♦ METALS ♦ NICKEL ♦ SPECTROSCOPY ♦ SYNCHROTRON RADIATION ♦ X RADIATION ♦ BREMSSTRAHLUNG ♦ CARBON ♦ CARBON COMPOUNDS ♦ ELECTROMAGNETIC RADIATION ♦ ELEMENTS ♦ IONIZING RADIATIONS ♦ MINERALS ♦ NONMETALS ♦ PHASE TRANSFORMATIONS ♦ RADIATIONS ♦ TRANSITION ELEMENTS ♦ Other Materials- Structure & Phase Studies
Abstract Identification using the extended x-ray absorption fine structure technique shows that nickel impurities found in synthetic diamonds exist as fcc Ni and contain an estimated amount of 2.7 +- 1.3 at.% carbon in solution.
Educational Use Research
Learning Resource Type Article
Publisher Date 1980-01-01
Publisher Department General Electric Corporate Research and Development, Schenectady, New York 12301
Publisher Place United States
Journal J. Appl. Phys.
Volume Number 51
Issue Number 1
Organization General Electric Corporate Research and Development, Schenectady, New York 12301


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