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Author Oden, P. I. ♦ Datskos, P. G. ♦ Thundat, T. ♦ Warmack, R. J.
Source United States Department of Energy Office of Scientific and Technical Information
Content type Text
Language English
Subject Keyword INSTRUMENTATION, INCLUDING NUCLEAR AND PARTICLE DETECTORS ♦ INFRARED RADIATION ♦ IMAGE SCANNERS ♦ PIEZOELECTRICITY ♦ ELECTRIC CONDUCTIVITY ♦ BENDING ♦ MIRRORS ♦ TEMPERATURE GRADIENTS
Abstract The operation of an uncooled, microcantilever-based infrared (IR) imaging device is demonstrated. Bending of the microcantilever is a function of the IR radiation intensity incident on the cantilever surface. The infrared image of the source is obtained by rastering a microfabricated cantilever over the image formed at the focal plane of a concave mirror. The bending variation of the microcantilever, as it scanned the focal plane of the mirror, is used to construct an infrared image of the source in front of the mirror. The thermal image obtained by scanning a single element cantilever is presented. {copyright} {ital 1996 American Institute of Physics.}
ISSN 00036951
Educational Use Research
Learning Resource Type Article
Publisher Date 1996-11-01
Publisher Department Oak Ridge National Laboratory
Publisher Place United States
Journal Applied Physics Letters
Volume Number 69
Issue Number 21
Organization Oak Ridge National Laboratory


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