Thumbnail
Access Restriction
Open

Author Gu, L. ♦ Oezdoel, V. B. ♦ Sigle, W. ♦ Koch, C. T. ♦ Srot, V. ♦ Aken, P. A. van
Source United States Department of Energy Office of Scientific and Technical Information
Content type Text
Language English
Subject Keyword CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY ♦ CORRELATIONS ♦ ELECTRON SPECTROSCOPY ♦ ELECTRONIC STRUCTURE ♦ ELECTRONS ♦ ENERGY GAP ♦ FERMI LEVEL ♦ INELASTIC SCATTERING ♦ NANOSTRUCTURES ♦ OPTICAL PROPERTIES ♦ SOLIDS ♦ SPATIAL RESOLUTION ♦ TRANSMISSION ELECTRON MICROSCOPY ♦ VALENCE ♦ ELECTRON MICROSCOPY ♦ ELEMENTARY PARTICLES ♦ ENERGY LEVELS ♦ FERMIONS ♦ LEPTONS ♦ MICROSCOPY ♦ PHYSICAL PROPERTIES ♦ RESOLUTION ♦ SCATTERING ♦ SPECTROSCOPY
Abstract Valence electron spectroscopic imaging (VESI) techniques, taking advantages of the energy-losses suffered by inelastic scattering of the fast electrons in the transmission electron microscope, offer an inherently high spatial resolution to characterize the electronic structure of materials close to the Fermi level. Here we demonstrate that the combination of an electron monochromator and a highly dispersive imaging energy filter, which has become available only recently, allows reliable measurements of local bandgaps on the nanometer scale. In addition, the correlations of structural, chemical, and optical properties can be revealed via VESI using monochromated electrons with a high spatial resolution.
ISSN 00218979
Educational Use Research
Learning Resource Type Article
Publisher Date 2010-01-15
Publisher Place United States
Journal Journal of Applied Physics
Volume Number 107
Issue Number 1


Open content in new tab

   Open content in new tab