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Author Elliott, W. C. ♦ Miceli, P. F. ♦ Tse, T. ♦ Stephens, P. W.
Source United States Department of Energy Office of Scientific and Technical Information
Content type Text
Language English
Subject Keyword MATERIALS SCIENCE ♦ SILVER ♦ ROUGHNESS ♦ MONOCRYSTALS ♦ EPITAXY ♦ GROWTH ♦ TEMPERATURE RANGE 0065-0273 K ♦ TEMPERATURE RANGE 0273-0400 K ♦ TEMPERATURE RANGE 0400-1000 K ♦ TEMPERATURE DEPENDENCE ♦ MORPHOLOGICAL CHANGES
Abstract Kinetic roughening during homoepitaxial growth was studied for Ag(111) and Ag(001). For Ag(111), from 150 to 500 K, the rms roughness exhibits a power law, {sigma}{proportional_to}{ital t}{sup {beta}} over nearly three decades in thickness. {beta}{approx_equal}1/2 at low temperatures, and there is an abrupt transition to smaller values above 300 K. In contrast, Ag(001) exhibits layer-by-layer growth with a significantly smaller {beta}. These results are the first to establish the evolution of surface roughness quantitatively for a broad thickness and temperature range, as well as for the case where growth kinetics are dominated by a step-ledge diffusion barrier. {copyright} {ital 1996 The American Physical Society.}
ISSN 01631829
Educational Use Research
Learning Resource Type Article
Publisher Date 1996-12-01
Publisher Place United States
Journal Physical Review, B: Condensed Matter
Volume Number 54
Issue Number 24


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