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Author Yahisa, Y. ♦ Kimoto, K. ♦ Usami, K. ♦ Matsuda, Y. ♦ Inagaki, J. ♦ Furusawa, K. ♦ Narishige, S.
Sponsorship IEEE Magnetics Society
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©1965
Language English
Subject Domain (in DDC) Natural sciences & mathematics ♦ Physics ♦ Electricity & electronics ♦ Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Electrons ♦ Spectroscopy ♦ Image analysis ♦ Chromium ♦ Sputtering ♦ Nonhomogeneous media ♦ Substrates ♦ Temperature ♦ Grain boundaries ♦ Lattices
Abstract The topographical nature of the compositional inhomogeneity in Co-17at.%Cr-5at.%Ta/Cr longitudinal thin film media deposited at different substrate temperature Ts, was analyzed using electron spectroscopic imaging. In the CoCrTa film deposited at high Ts, Cr segregates to the grain boundaries and intragrains, resulting in a two-dimensional network. The compositional variation grew as Ts became high. The concentration of the Cr enriched region was in the range 20-30 at.%, and that of the Cr depleted region was in the range 5-10 at.% for the sample Ts=270/spl deg/C. A strain-free CoCrTa(11.
Description Author affiliation :: Data Storage & Retrieval Syst. Div., Hitachi Ltd., Kanagawa, Japan
ISSN 00189464
Education Level UG and PG
Learning Resource Type Article
Publisher Date 1995-11-01
Publisher Place U.S.A.
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Volume Number 31
Issue Number 6
Size (in Bytes) 459.62 kB
Page Count 3
Starting Page 2836
Ending Page 2838


Source: IEEE Xplore Digital Library