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Author Gruverman, A. ♦ Auciello, O. ♦ Tokumoto, H.
Source United States Department of Energy Office of Scientific and Technical Information
Content type Text
Language English
Subject Keyword MATERIALS SCIENCE ♦ PZT ♦ FATIGUE ♦ THIN FILMS ♦ DOMAIN STRUCTURE ♦ POLARIZATION ♦ PIEZOELECTRICITY ♦ HYSTERESIS ♦ SWITCHING ♦ ATOMIC FORCE MICROSCOPY
Abstract Scanning force microscopy has been used to perform a comparative nanoscale study of domain structures and switching behavior of Pb(Zr{sub {ital x}}Ti{sub 1{minus}{ital x}})O{sub 3} (PZT) thin films integrated into heterostructures with different electrodes. The study revealed a significant difference between polarization state of as-deposited PZT films on RuO{sub 2} and Pt electrodes. The PZT/RuO{sub 2} films exhibit polydomain crystallites and show almost symmetric switching behavior, while the PZT/Pt films are mainly in a single polarity state and exhibit highly asymmetric piezoelectric hysteresis loops. Formation of unswitchable polarization within the grains of submicron size as a result of fatigue process was directly observed. {copyright} {ital 1996 American Institute of Physics.}
ISSN 00036951
Educational Use Research
Learning Resource Type Article
Publisher Date 1996-11-01
Publisher Place United States
Journal Applied Physics Letters
Volume Number 69
Issue Number 21


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