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Author Dai, Jianwei ♦ Wang, Lei ♦ Lombardi, Fabrizio
Source ACM Digital Library
Content type Text
Publisher Association for Computing Machinery (ACM)
File Format PDF
Copyright Year ©2010
Language English
Subject Domain (in DDC) Computer science, information & general works ♦ Data processing & computer science
Subject Keyword QCA ♦ Defect tolerance ♦ Information theoretic analysis ♦ Reliability
Abstract Quantum-dot cellular automata (QCA) has been advocated as a promising emerging nanotechnology for designing future nanocomputing systems. However, at device level, the large number of expected defects represents a significant hurdle for reliable computation in QCA-based systems. In this paper, we present an information-theoretic approach to investigate the relationship between defect tolerance and redundancy in QCA devices. By modeling defect-prone QCA devices as unreliable information processing media, we determine the information transfer capacity, as bound on the reliability that QCA devices can achieve. The proposed method allows to evaluate the effectiveness of redundancy-based defect tolerance in an effective and quantitative manner.
ISSN 15504832
Age Range 18 to 22 years ♦ above 22 year
Educational Use Research
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2010-08-01
Publisher Place New York
e-ISSN 15504840
Journal ACM Journal on Emerging Technologies in Computing Systems (JETC)
Volume Number 6
Issue Number 3
Page Count 19
Starting Page 1
Ending Page 19

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Source: ACM Digital Library