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Author Bozovic, Dolores ♦ Bockrath, M. ♦ Hafner, Jason H. ♦ Lieber, Charles M. ♦ Park, Hongkun ♦ Tinkham, M.
Sponsorship (US)
Source United States Department of Energy Office of Scientific and Technical Information
Content type Text
Publisher The American Physical Society
Language English
Subject Keyword CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS ♦ CARBON ♦ DEFECTS ♦ FERMI LEVEL ♦ MICROSCOPES ♦ MICROSCOPY ♦ PHYSICS
Abstract We have used an atomic-force microscope tip to mechanically buckle single-walled carbon nanotubes. The resistance of the induced defects ranged from 10 to 100 k{Omega} and varied with the local Fermi level, as determined by scanned-gate microscopy. By forming two closely spaced defects on metallic nanotubes, we defined quantum dots less than 100 nm in length. These devices exhibited single-electron charging behavior at temperatures up to {similar_to}165 K. {copyright} 2001 American Institute of Physics.
ISSN 00036951
Educational Use Research
Learning Resource Type Article
Publisher Date 2001-06-04
Publisher Place United States
Journal Applied Physics Letters
Volume Number 78
Issue Number 23


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