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Author Wilcoxon, J. P. ♦ Craft, S. A. ♦ Thurston, T. R.
Source United States Department of Energy Office of Scientific and Technical Information
Content type Text
Language English
Subject Keyword INSTRUMENTATION, INCLUDING NUCLEAR AND PARTICLE DETECTORS ♦ SMALL ANGLE SCATTERING ♦ SYNCHROTRON RADIATION ♦ NSLS ♦ X RADIATION ♦ LIQUID CRYSTALS ♦ ATOMIC CLUSTERS ♦ POLYSTYRENE ♦ STRUCTURE FACTORS ♦ RESOLUTION
Abstract We describe the construction and performance of a small-angle x-ray scattering (SAXS) instrument which we have used on several beam lines at the National Synchrotron Light Source. The analyzer crystal was a channel cut Si(1,1,1) designed for use at {lambda}=1.54 A with a measured efficiency of 60{percent} and an angular resolution full width at half maximum of 0.001{degree}. In the case of strongly scattering samples (i.e., powders), momentum transfer {ital q} between 1{times}10{sup {minus}4} A{lt}{ital q}{lt}0.1 A{sup {minus}1} could be studied with over eight decades of dynamic intensity range. We demonstrate the versatility of this instrument by performing scattering experiments on a variety of spherical latex samples spanning the size range from 50 to 800 nm, liquid crystal samples with sharp, asymmetrical Bragg peaks, and metal clusters with sizes less than 10 nm. Small-angle x-ray scattering data for the larger polystyrene samples is compared with light scattering data and theoretical structure factors, and the relative roles of instrument smearing, sample polydispersity, and interparticle interference are elucidated. In the case of the liquid crystal samples, the high resolution of the instrument allows structural features to be observed that were previously obscured by the instrumental resolution in other small-angle neutron and synchroton-based Kratky camera data taken on the same samples. {copyright} {ital 1996 American Institute of Physics.}
ISSN 00346748
Educational Use Research
Learning Resource Type Article
Publisher Date 1996-09-01
Publisher Department Brookhaven National Lab. (BNL), Upton, NY (United States)
Publisher Place United States
Journal Review of Scientific Instruments
Volume Number 67
Issue Number 9
Organization Brookhaven National Lab. (BNL), Upton, NY (United States)


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