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Author Hubaux, Arnaud ♦ Tun, Thein Than ♦ Heymans, Patrick
Source ACM Digital Library
Content type Text
Publisher Association for Computing Machinery (ACM)
File Format PDF
Copyright Year ©2013
Language English
Subject Domain (in DDC) Computer science, information & general works ♦ Data processing & computer science
Subject Keyword Software product line ♦ Feature diagram ♦ Separation of concerns ♦ Variability
Abstract The need for flexible customization of large feature-rich software systems, according to requirements of various stakeholders, has become an important problem in software development. Among the many software engineering approaches dealing with variability management, the notion of Software Product Line (SPL) has emerged as a major unifying concept. Drawing from established disciplines of manufacturing, SPL approaches aim to design repertoires of software artifacts, from which customized software systems for specific stakeholder requirements can be developed. A major difficulty SPL approaches attempt to address is the modularization of software artifacts, which reconciles the user's needs for certain features and the development and technical constraints. Towards this end, many SPL approaches use feature diagrams to describe possible configurations of a feature set. There have been several proposals for feature diagram languages with varying degrees of expressiveness, intuitiveness, and precision. However, these feature diagram languages have limited scalability when applied to realistic software systems. This article provides a systematic survey of various concerns of feature diagrams and ways in which concerns have been separated. The survey shows how the uncertainty in the purpose of feature diagram languages creates both conceptual and practical limitations to scalability of those languages.
ISSN 03600300
Age Range 18 to 22 years ♦ above 22 year
Educational Use Research
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2013-08-01
Publisher Place New York
e-ISSN 15577341
Journal ACM Computing Surveys (CSUR)
Volume Number 45
Issue Number 4
Page Count 23
Starting Page 1
Ending Page 23


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Source: ACM Digital Library