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Author Frankl, D. R.
Sponsorship USDOE
Source United States Department of Energy Office of Scientific and Technical Information
Content type Text
Language English
Subject Keyword PHYSICS ♦ ABSORPTION ♦ CRYSTALS ♦ DIFFRACTION ♦ ELECTRONS ♦ MEASURED VALUES ♦ RELATIVITY THEORY ♦ SILICON
Abstract A method is described for the measurement of the extinction distance for electrons transmitted through crystals. Results for Si are in excellent agreement with dynamical diffraction theory if relativistic corrections are taken into account. (auth)
ISSN 00218979
Educational Use Research
Learning Resource Type Article
Publisher Date 1964-01-01
Publisher Department Univ. of Illinois, Urbana
Journal Journal of Applied Physics
Volume Number 35
Organization Univ. of Illinois, Urbana


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