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Author Campbell, A.B. ♦ Musseau, O. ♦ Ferlet-Cavrois, V. ♦ Stapor, W.J. ♦ McDonald, P.T.
Sponsorship IEEE Nuclear and Plasma Sciences Society ♦ Computer Applications in Nuclear and Plasma Sciences (CANPS) ♦ Lawrence Berkeley Lab. ♦ Lawrence Livermore Nat. Lab. ♦ APS ♦ College of William and Mary ♦ Continuous Electron Beam Accelerator Facility ♦ NASA ♦ Defence Nuclear Agency ♦ Sandia National Laboratories ♦ Jet Propulsion Laboratory ♦ Brookhaven Nat. Lab. ♦ Lawrence Livermore Nat. Lab ♦ IEEE/NPPS Radiat. Effects Committee ♦ Defence Nuclear Agency/DoD ♦ Sandia National Laboratories/DOE ♦ Jet Propulsion Laboratory/NASA ♦ Phillips Lab./DoD
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©1963
Language English
Subject Domain (in DDC) Natural sciences & mathematics ♦ Physics ♦ Modern physics ♦ Technology ♦ Medicine & health ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Random access memory ♦ Ionization ♦ Ion accelerators ♦ Integrated circuit measurements ♦ Charge transfer ♦ Space charge ♦ CMOS technology ♦ Isolation technology ♦ Laboratories ♦ Current measurement
Abstract Investigation of single event effects at grazing angle by both charge collection and multiple bit upset measurements evidences modified collection mechanisms with charge transfer between adjacent reverse biased structures.
Description Author affiliation :: Naval Res. Lab., Washington, DC, USA
ISSN 00189499
Education Level UG and PG
Learning Resource Type Article
Publisher Date 1998-06-01
Publisher Place U.S.A.
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Volume Number 45
Issue Number 3
Size (in Bytes) 882.57 kB
Page Count 9
Starting Page 1603
Ending Page 1611


Source: IEEE Xplore Digital Library