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Author Daugherty, M.A. ♦ Maekawa, R. ♦ Van Sciver, S.W.
Sponsorship Council on Superconductivity ♦ Appl. Superconductivity Conference Inc ♦ MIT
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2002
Language English
Subject Domain (in DDC) Natural sciences & mathematics ♦ Physics ♦ Electricity & electronics ♦ Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Conductors ♦ Friction ♦ Ducts ♦ Hydraulic diameter ♦ Superconducting cables ♦ Temperature ♦ Fluid flow measurement ♦ Shape measurement ♦ Superconductivity
Abstract The authors measured the pressure drop of supercritical helium and He II counterflow heat transport in subscale cable-in-conduit conductors (CICCs) at a variety of different temperatures. These measurements were made on various conductors with different flow areas, void fractions, and strand diameters. Classical friction factor analysis was used to correlate the pressure drop results. The results of this analysis revealed systematic variations in the friction factor which appear to be dependent on the temperature of the helium. In a separate experiment heat transport in He II contained in the CICCs was analyzed in terms of the Gorter-Mellink relationship to obtain an independent determination of the flow cross-sectional area. These cross-sectional areas were used to reanalyze previously reported pressure drop data on the same conductors. Use of He II counterflow measurements as a general method to characterize the hydraulics of these conductors is discussed.<<ETX>>
Description Author affiliation :: Appl. Superconductivity Center, Wisconsin Univ., Madison, WI, USA
ISSN 10518223
Education Level UG and PG
Learning Resource Type Article
Publisher Date 1993-03-01
Publisher Place U.S.A.
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Volume Number 3
Issue Number 1
Size (in Bytes) 260.78 kB
Page Count 3
Starting Page 500
Ending Page 502

Source: IEEE Xplore Digital Library