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Author LaBel, K.A. ♦ Gates, M.M.
Sponsorship IEEE Nuclear and Plasma Sciences Society ♦ Computer Applications in Nuclear and Plasma Sciences (CANPS) ♦ Lawrence Berkeley Lab. ♦ Lawrence Livermore Nat. Lab. ♦ APS ♦ College of William and Mary ♦ Continuous Electron Beam Accelerator Facility ♦ NASA ♦ Defence Nuclear Agency ♦ Sandia National Laboratories ♦ Jet Propulsion Laboratory ♦ Brookhaven Nat. Lab. ♦ Lawrence Livermore Nat. Lab ♦ IEEE/NPPS Radiat. Effects Committee ♦ Defence Nuclear Agency/DoD ♦ Sandia National Laboratories/DOE ♦ Jet Propulsion Laboratory/NASA ♦ Phillips Lab./DoD
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©1963
Language English
Subject Domain (in DDC) Natural sciences & mathematics ♦ Physics ♦ Modern physics ♦ Technology ♦ Medicine & health ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Space vehicles ♦ Space technology ♦ Aircraft manufacture ♦ CMOS technology ♦ Integrated circuit technology ♦ Manufacturing ♦ Solid state circuits ♦ Aerospace engineering ♦ Design engineering ♦ NASA
Abstract With the sharp decline in the availability of radiation-hardened devices from manufacturers, as well as the desire to shrink power, weight, and volume of spacecraft systems, the use of devices that are susceptible to single-event effects (SEEs) has become commonplace. We present herein a perspective and user's tool for understanding SEE's and potential system-level mitigation techniques.
Description Author affiliation :: NASA Goddard Space Flight Center, Greenbelt, MD, USA
ISSN 00189499
Education Level UG and PG
Learning Resource Type Article
Publisher Date 1996-04-01
Publisher Place U.S.A.
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Volume Number 43
Issue Number 2
Size (in Bytes) 912.02 kB
Page Count 7
Starting Page 654
Ending Page 660

Source: IEEE Xplore Digital Library