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Author Dehon, Andr
Source ACM Digital Library
Content type Text
Publisher Association for Computing Machinery (ACM)
File Format PDF
Copyright Year ©2005
Language English
Subject Domain (in DDC) Computer science, information & general works ♦ Data processing & computer science
Subject Keyword Defect tolerance ♦ Manhattan mesh ♦ Nanowires ♦ Programmable interconnect ♦ Programmable logic arrays ♦ Stochastic construction ♦ Sublithographic architecture
Abstract Chemists can now construct wires which are just a few atoms in diameter; these wires can be selectively field-effect gated, and wire crossings can act as diodes with programmable resistance. These new capabilities present both opportunities and challenges for constructing nanoscale computing systems. The tiny feature sizes offer a path to economically scale down to atomic dimensions. However, the associated bottom-up synthesis techniques only produce highly regular structures and come with high defect rates and minimal control during assembly. To exploit these technologies, we develop nanowire-based architectures which can bridge between lithographic and atomic-scale feature sizes and tolerate defective and stochastic assembly of regular arrays to deliver high density universal computing devices. Using 10nm pitch nanowires, these nanowire-based programmable architectures offer one to two orders of magnitude greater mapped-logic density than defect-free lithographic FPGAs at 22nm.
ISSN 15504832
Age Range 18 to 22 years ♦ above 22 year
Educational Use Research
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2005-07-01
Publisher Place New York
e-ISSN 15504840
Journal ACM Journal on Emerging Technologies in Computing Systems (JETC)
Volume Number 1
Issue Number 2
Page Count 54
Starting Page 109
Ending Page 162

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Source: ACM Digital Library