Thumbnail
Access Restriction
Open

Author Strelcov, Evgheni ♦ Kim, Yunseok ♦ Jesse, Stephen ♦ Ivanov, Ilia N. ♦ Wang, Chih-Hung ♦ Teng, Yung-Chun ♦ Chu, Ying Hao ♦ Kalinin, Sergei V.
Sponsorship USDOE Office of Science (SC)
Source United States Department of Energy Office of Scientific and Technical Information
Content type Text
Language English
Subject Keyword SPM ♦ ionic dynamics ♦ Ca-BFO ♦ voltage spectroscopy ♦ oxygen vacancy
Abstract A scanning probe microscopy (SPM) based technique for probing local ionic dynamics in electrochemically-active materials based on the first-order reversal curve current-voltage (FORC-IV) method is presented. FORC-IV imaging mode is applied to a Ca-substituted bismuth ferrite (Ca-BFO) system to separate the electronic and ionic phenomena in this material and visualize the spatial variability of these behaviors. The variable-temperature measurements further demonstrate the interplay between the thermally and electric-field-driven resistance changes in Ca-BFO. The FORC-IV is shown to be a simple, powerful and flexible method for studying electrochemical activity of materials at the nanoscale and, in conjunction with the Electrochemical Strain Microscopy, for differentiating ferroelectric and ionic behaviors.
ISSN 15306984
Educational Use Research
Learning Resource Type Article
Publisher Date 2013-01-01
Publisher Place United States
Journal Nano Letters
Volume Number 13
Issue Number 8
Organization Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States) ♦ Center for Nanophase Materials Sciences


Open content in new tab

   Open content in new tab