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Author Alkathy, Mahmoud S. ♦ Goud, J. Pundareekam ♦ Raju, K. C. James
Source United States Department of Energy Office of Scientific and Technical Information
Content type Text
Language English
Subject Keyword CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY ♦ BISMUTH ADDITIONS ♦ CERAMICS ♦ DIELECTRIC MATERIALS ♦ ELECTRON SCANNING ♦ GRAIN SIZE ♦ IMPEDANCE ♦ LITHIUM ADDITIONS ♦ LOSSES ♦ PERMITTIVITY ♦ SCANNING ELECTRON MICROSCOPY ♦ SINTERING ♦ STRONTIUM TITANATES ♦ TEMPERATURE RANGE 0273-0400 K ♦ X RADIATION ♦ X-RAY DIFFRACTION
Abstract Sintering is an important factor that affects the microstructure development in ceramics. In this work, Bi and Li co-substituted Strontium Titanate (ST) ceramics samples sintered at different temperatures are prepared and analyzed by X-Ray Diffraction (XRD) and Scanning Electron Microscopy (SEM). XRD was used to detect phase structure of the sintered samples and SEM was used for microstructure analysis. Dielectric properties of Bi and Li co-substituted SrTiO{sub 3} samples were measured using Agilent 4294A Impedance analyzer in the frequency range 40 Hz to 5 MHz at room temperature. The result reveals that the dielectric constant of Bi and Li co-substituted SrTiO{sub 3} ceramics increases with increasing sintering temperature up to 1250°C and then decreases beyond that. The highest value of dielectric constant obtained is 860 at 1KHz frequency and lowest dielectric loss observed is 0.04 at the same frequency for samples sintered at 1250°C. Also the grain size increases with increase of sintering temperature.
ISSN 0094243X
Educational Use Research
Learning Resource Type Article
Publisher Date 2016-05-06
Publisher Place United States
Volume Number 1728
Issue Number 1


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