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Author Soni, Sheetal ♦ Pandey, A. ♦ Gupta, Ratnesh ♦ Sinha, A. K.
Source United States Department of Energy Office of Scientific and Technical Information
Content type Text
Language English
Subject Keyword CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY ♦ ANNEALING ♦ DIFFUSION ♦ FCC LATTICES ♦ FILMS ♦ GRAIN ORIENTATION ♦ INDUS-2 ♦ LASER RADIATION ♦ PHASE STABILITY ♦ RELAXATION ♦ SHEETS ♦ SOLID SOLUTIONS ♦ SYNCHROTRON RADIATION ♦ TEXTURE ♦ TITANIUM ♦ TITANIUM CARBIDES ♦ TITANIUM NITRIDES ♦ X-RAY DIFFRACTION
Abstract In-plane and Out-of-plane Grazing incidence X-ray diffraction is used to characterize the preferred orientation present in the titanium carbonitride films using ADXRD beamline at INDUS 2 synchrotron radiation source. GIXRD shows the formation of mixture of FCCTiC{sub x}N{sub (1-x)} films for different values of x along with the solid solution. From the in-plane and out-of-plane XRD measurements, we have observed that a specific texture along the c-axis of Ti has been formed during the laser treatment process. Due to the diffusion of C and N into Ti, the resistance of the specimen has been decreases with respect to the resistance of pure Ti sheet. The formed phases are stable and there is no structural relaxation has been observed during annealing process.
ISSN 0094243X
Educational Use Research
Learning Resource Type Article
Publisher Date 2015-06-24
Publisher Place United States
Volume Number 1665
Issue Number 1


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