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Author Patwardhan, Jaidev ♦ Dwyer, Chris ♦ Lebeck, Alvin R.
Source ACM Digital Library
Content type Text
Publisher Association for Computing Machinery (ACM)
File Format PDF
Copyright Year ©2007
Language English
Subject Domain (in DDC) Computer science, information & general works ♦ Data processing & computer science
Subject Keyword DNA ♦ SIMD ♦ Self-organizing ♦ Bit-serial ♦ Data parallel ♦ Defect tolerance ♦ Nanocomputing
Abstract The continual decrease in transistor size (through either scaled CMOS or emerging nanotechnologies) promises to usher in an era of tera to peta-scale integration but with increasing defects. Regardless of fabrication methodology (top-down or bottom-up), defect-tolerant architectures are necessary to exploit the full potential of future increased device densities. This article explores a defect-tolerant SIMD architecture (SOSA) that self-organizes a large number of limited capability nodes with high defect rates into SIMD processing elements. Simulation results show that SOSA matches or exceeds the performance of conventional systems for moderate to large problems, but with lower power density.
ISSN 15504832
Age Range 18 to 22 years ♦ above 22 year
Educational Use Research
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2007-07-01
Publisher Place New York
e-ISSN 15504840
Journal ACM Journal on Emerging Technologies in Computing Systems (JETC)
Volume Number 3
Issue Number 2


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Source: ACM Digital Library