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Author Hadlock, Frank
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©1963
Language English
Subject Domain (in DDC) Computer science, information & general works ♦ Data processing & computer science
Subject Keyword Circuit faults ♦ Circuit synthesis ♦ Laboratories ♦ Weight control ♦ Switching circuits ♦ Circuit testing ♦ Decoding ♦ Terminology
Abstract A method is described for constructing a set of input patterns able to detect every given failure of a combinational network. The result may not be a minimal set of tests, but it is surely a complete test.
Description Author affiliation :: General Electric Co., Syracuse, N. Y.
ISSN 03677508
Education Level UG and PG
Learning Resource Type Article
Publisher Date 1967-10-01
Publisher Place New York, U.S.A.
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Volume Number EC-16
Issue Number 5
Size (in Bytes) 380.38 kB
Page Count 2
Starting Page 674
Ending Page 675


Source: IEEE Xplore Digital Library