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Author Barke, Martin ♦ Schlichtmann, Ulf
Source ACM Digital Library
Content type Text
Publisher Association for Computing Machinery (ACM)
File Format PDF
Copyright Year ©2015
Language English
Subject Domain (in DDC) Computer science, information & general works ♦ Data processing & computer science
Subject Keyword HCI ♦ NBTI ♦ Robustness ♦ Cross-layer
Abstract The demands on system robustness and its immunity against perturbations are getting increasingly important. Nearly everybody has an intuitive understanding of what robustness means, but there is no proper way how to measure robustness of integrated circuits already during the design phase. Therefore, a general cross-layer robustness model and methods to quantitatively measure robustness are presented. Moreover, these methods are refined to predict the robustness against degradation of digital circuits due to aging effects.
Description Author Affiliation: Technische Universität München, Munchen, Germany (Barke, Martin; Schlichtmann, Ulf)
ISSN 15504832
Age Range 18 to 22 years ♦ above 22 year
Educational Use Research
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2015-09-01
Publisher Place New York
e-ISSN 15504840
Journal ACM Journal on Emerging Technologies in Computing Systems (JETC)
Volume Number 12
Issue Number 3
Page Count 22
Starting Page 1
Ending Page 22

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Source: ACM Digital Library