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Author Eng Leong Tan
Sponsorship IEEE Microwave Theory and Techniques Society
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©1963
Language English
Subject Domain (in DDC) Natural sciences & mathematics ♦ Physics ♦ Electricity & electronics ♦ Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Finite difference methods ♦ Time domain analysis ♦ Equations ♦ Numerical simulation ♦ Stability analysis ♦ Anisotropic magnetoresistance ♦ Arithmetic ♦ Electromagnetic fields ♦ Magnetic fields ♦ unconditionally stable methods ♦ Computational electromagnetics ♦ Crank–Nicolson methods ♦ finite-difference time-domain (FDTD) methods
Abstract This paper presents new efficient algorithms for implementing 3-D Crank-Nicolson-based finite-difference time-domain (FDTD) methods. Two recent methods are considered, namely, the Crank-Nicolson direct-splitting (CNDS) and Crank-Nicolson cycle-sweep-uniform (CNCSU) FDTD methods. The algorithms involve update equations whose right-hand sides are much simpler and more concise than the original ones. Analytical proof is provided to show the equivalence of original and present methods. Comparison of their implementations signifies substantial reductions of the floating-point operations count in the new algorithms. Other computational aspects are also optimized, particularly in regard to the for-looping overhead and the memory space requirement. Through numerical simulation and Fourier stability analysis, it is found that while the CNDS FDTD is unconditionally stable, the CNCSU FDTD may actually become unstable.
Description Author affiliation :: Nanyang Technol. Univ., Singapore
ISSN 00189480
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2008-02-01
Publisher Place U.S.A.
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Volume Number 56
Issue Number 2
Size (in Bytes) 313.88 kB
Page Count 6
Starting Page 408
Ending Page 413

Source: IEEE Xplore Digital Library