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Author Kakiuchi, Takuhiro ♦ Kobayashi, Eiichi ♦ Okudaira, Koji K. ♦ Fujita, Narihiko ♦ Tanaka, Masatoshi ♦ Mase, Kazuhiko
Source J-STAGE
Content type Text
Publisher The Japan Society for Analytical Chemistry
Language English
Abstract We have developed a miniature electron ion coincidence (EICO) analyzer mounted on a conflat flange with an outer diameter of 114 mm. It consists of a cylindrical mirror analyzer (CMA), a time-of-flight ion mass spectrometer (TOF-MS), a commercially available linear motion feedthrough, and a tilt adjustment mechanism. Each sample surface was irradiated by synchrotron radiation, and the energies of emitted electrons were analyzed and detected by the CMA, while desorbed ions were collected by the TOF-MS in coincidence with the electrons. The performance of the EICO analyzer was tested by measuring the Auger-electron $H^{+}$ photoion coincidence spectrum of condensed water at $4a_{1}$ ← O 1s resonance.
ISSN 09106340
Learning Resource Type Article
Publisher Date 2008-01-01
e-ISSN 13482246
Journal Analytical Sciences(analsci)
Volume Number 24
Issue Number 1
Page Count 6
Starting Page 87
Ending Page 92


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