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Author Stosnach, Hagen
Source J-STAGE
Content type Text
Publisher The Japan Society for Analytical Chemistry
Language English
Abstract Total reflection X-ray fluorescence (TXRF) analysis is an established technique for trace-element analysis in various types of samples. Though expensive large-scale systems restricted the applications in the past, in this study the capability of a benchtop system for trace elemental analysis is reported. The suitability of this system for the mobile on-site analysis of heavy metal contaminated soils and sediments is reported as well as the possibilities and restrictions of TXRF for additional applications, including trace-element analysis of water, glass and biological samples.
ISSN 09106340
Learning Resource Type Article
Publisher Date 2005-01-01
e-ISSN 13482246
Journal Analytical Sciences(analsci)
Volume Number 21
Issue Number 7
Page Count 4
Starting Page 873
Ending Page 876


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