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Author Seokho Kim ♦ Jeonwook Cho ♦ Ki-Deok Sim ♦ Joon-Han Bae ♦ Jae-Ho Kim ♦ Chang-Young Lee ♦ Hyun-Man Jang
Sponsorship Council on Superconductivity ♦ Appl. Superconductivity Conference Inc ♦ MIT
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2002
Language English
Subject Domain (in DDC) Natural sciences & mathematics ♦ Physics ♦ Electricity & electronics ♦ Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword High temperature superconductors ♦ Power cables ♦ Fault currents ♦ Circuit breakers ♦ Safety ♦ Pulsed power supplies ♦ Accidents ♦ Protection ♦ Thermal degradation ♦ Superconducting cables ♦ stabilizer ♦ Fault current ♦ heat transfer ♦ HTS power cable
Abstract During the operation of HTS power cable, large fault current can be introduced to a HTS power cable due to several accidents. In this case, a circuit breaker limits the fault current to protect the HTS power cable just as conventional power cables. However, heat is necessarily generated until the circuit breaker operates and severe performance degradation or even burn-out can occur at HTS tapes. To ensure the safety against the fault current, thermal characteristic of the HTS power cable should be verified under the fault current. Several experiments with a simple cable are performed using an AC pulse power supply. During the experiment, the increase of temperature and current redistribution are measured for the various fault current conditions. Through the experiments, safety margin of Korean HTS power cable is verified and the allowable peak current is suggested
Description Author affiliation :: Korea Electrotechnol. Res. Inst., Changwon
ISSN 10518223
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2006-06-01
Publisher Place U.S.A.
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Volume Number 16
Issue Number 2
Size (in Bytes) 405.98 kB
Page Count 4
Starting Page 1598
Ending Page 1601


Source: IEEE Xplore Digital Library