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Author Nilsson, L. ♦ Groening, O. ♦ Groening, P. ♦ Schlapbach, L.
Sponsorship (US)
Source United States Department of Energy Office of Scientific and Technical Information
Content type Text
Publisher The American Physical Society
Language English
Subject Keyword CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS ♦ ANODES ♦ CARBON ♦ ELECTRONS ♦ FIELD EMISSION ♦ HEATING ♦ PHYSICS ♦ REMOVAL
Abstract The current-induced emission degradation of a carbon nanotube (CNT) thin-film electron emitter is studied under constant emission current for different current levels, using a scanning anode field emission microscope. A permanent emission degradation is observed for emission currents higher than 300 nA per CNT and is associated with resistive heating at the CNT--substrate interface for the sample under investigation. A second field-induced emission degradation mechanism, associated with the removal of CNTs from the substrate, is also reported. {copyright} 2001 American Institute of Physics.
ISSN 00036951
Educational Use Research
Learning Resource Type Article
Publisher Date 2001-08-13
Publisher Place United States
Journal Applied Physics Letters
Volume Number 79
Issue Number 7


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