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Author Patwardhan, Jaidev P. ♦ Dwyer, Chris ♦ Lebeck, Alvin R. ♦ Sorin, Daniel J.
Source ACM Digital Library
Content type Text
Publisher Association for Computing Machinery (ACM)
File Format PDF
Copyright Year ©2006
Language English
Subject Domain (in DDC) Computer science, information & general works ♦ Data processing & computer science
Subject Keyword Accumulator ISA ♦ DNA ♦ Active network ♦ Carbon nanotube ♦ Defect isolation ♦ Defect tolerance ♦ Nanocomputing ♦ Nanoelectronics ♦ Reverse path forwarding ♦ Self-assembly
Abstract This article explores the architectural challenges introduced by emerging bottom-up fabrication of nanoelectronic circuits. The specific nanotechnology we explore proposes patterned DNA nanostructures as a scaffold for the placement and interconnection of carbon nanotube or silicon nanorod FETs to create a limited size circuit (node). Three characteristics of this technology that significantly impact architecture are (1) limited node size, (2) random node interconnection, and (3) high defect rates. We present and evaluate an accumulator-based active network architecture that is compatible with any technology that presents these three challenges. This architecture represents an initial, unoptimized solution for understanding the implications of DNA-guide self-assembly.
ISSN 15504832
Age Range 18 to 22 years ♦ above 22 year
Educational Use Research
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2006-01-01
Publisher Place New York
e-ISSN 15504840
Journal ACM Journal on Emerging Technologies in Computing Systems (JETC)
Volume Number 2
Issue Number 1
Page Count 30
Starting Page 1
Ending Page 30

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Source: ACM Digital Library