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Author Lee, Yann-Heng ♦ Shin, Kang G.
Source ACM Digital Library
Content type Text
Publisher Association for Computing Machinery (ACM)
File Format PDF
Copyright Year ©1988
Language English
Subject Domain (in DDC) Computer science, information & general works ♦ Data processing & computer science
Abstract In this paper, a new method is presented for (i) determining an optimal retry policy and (ii) using retry for fault characterization, which is defined as classification of the fault type and determination of fault durations. First, an optimal retry policy is derived for a given fault characteristic, which determines the maximum allowable retry durations so as to minimize the total task completion time. Then, the $\textit{combined}$ fault characterization and retry decision, in which the characteristic of a fault is estimated simultaneously with the determination of the optimal retry policy, are carried out. Two solution approaches are developed: one is based on point estimation and the other on Bayes sequential decision analysis.Numerical examples are presented in which all the durations associated with faults (i.e., active, benign, and interfailure durations) have monotone hazard rate functions (e.g., exponential Weibull and gamma distributions). These are standard distributions commonly used for modeling and analyses of faults.
ISSN 00045411
Age Range 18 to 22 years ♦ above 22 year
Educational Use Research
Education Level UG and PG
Learning Resource Type Article
Publisher Date 1988-01-01
Publisher Place New York
e-ISSN 1557735X
Journal Journal of the ACM (JACM)
Volume Number 35
Issue Number 1
Page Count 25
Starting Page 45
Ending Page 69


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Source: ACM Digital Library