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Author Kohnen, T. ♦ Koning, J. J. ♦ Burghoorn, J. ♦ Wyder, P. ♦ Lejay, P.
Source United States Department of Energy Office of Scientific and Technical Information
Content type Text
Language English
Subject Keyword PHYSICS ♦ INSTRUMENTATION, INCLUDING NUCLEAR AND PARTICLE DETECTORS ♦ URANIUM COMPOUNDS ♦ REFLECTIVITY ♦ RUTHENIUM COMPOUNDS ♦ SILICON COMPOUNDS ♦ FABRY-PEROT INTERFEROMETER ♦ TESTING ♦ FAR INFRARED RADIATION ♦ MAGNETIC FIELDS ♦ TEMPERATURE DEPENDENCE ♦ TEMPERATURE RANGE 0000-0013 K ♦ TEMPERATURE RANGE 0013-0065 K
Abstract A far-infrared reflectivity set up has been developed for spectroscopy on highly reflective materials in a 20 T-class resistive Bitter magnet. As a first application, far-infrared reflectivity measurements on the heavy-fermion compound URu{sub 2}Si{sub 2} have been performed using a silicon reflection Fabry-P{acute e}rot interferometer as a multiple reflection device. In a resonance, this Fabry-P{acute e}rot technique is one order of magnitude more sensitive than a single reflection measurement. Changes in the reflectivity as a function of magnetic field are resolved with an accuracy of 0.2% and the absolute value of the reflectivity can be obtained with an accuracy of 0.5%. With this interferometer, an excitation at about 40 cm{sup -1} in the heavy-fermion system URu{sub 2}Si{sub 2} is investigated at temperatures between 2 and 20 Kelvin and in magnetic fields up to 20 T. The excitation appears to extend to lower energies under influence of a large magnetic field. {copyright} {ital 1996 American Institute of Physics.}
ISSN 00346748
Educational Use Research
Learning Resource Type Article
Publisher Date 1996-12-01
Publisher Place United States
Journal Review of Scientific Instruments
Volume Number 67
Issue Number 12


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