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Author Barzola-Quiquia, J. ♦ Ziese, M. ♦ Esquinazi, P. ♦ Garcia, N.
Source arXiv.org
Content type Text
File Format PDF
Date of Submission 2009-12-07
Language English
Subject Domain (in DDC) Computer science, information & general works ♦ Natural sciences & mathematics ♦ Physics
Subject Keyword Condensed Matter - Superconductivity ♦ Condensed Matter - Mesoscale and Nanoscale Physics ♦ physics:cond-mat
Abstract Point-contact Andreev reflection measurements of Co/ and Cu/tungsten-carbide (WC$_x$) contacts are presented. Metallic thin films were patterned by e-beam-lithography and lift-off; tungsten carbide superconducting tips were grown directly on the pre-patterned samples by decomposition of a metallo-organic vapour (tungsten hexacarbonyl) under a focused Ga$^+$-ion beam (FIB). Current-voltage measurements as a function of temperature and magnetic field clearly showed the signatures of Andreev reflection. The experimental conductance-voltage curves were analyzed within the Blonder-Tinkham-Klapwijk theory. The results highlight the possibilities, advantages and disadvantages of using FIB-produced amorphous WC$_x$ tips for point-contact spectroscopy in metallic nanostructures.
Educational Use Research
Learning Resource Type Article
Page Count 11


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