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Author Konovalov, Sergey ♦ Alsaraeva, Krestina ♦ Gromov, Victor ♦ Semina, Olga ♦ Ivanov, Yurii
Source United States Department of Energy Office of Scientific and Technical Information
Content type Text
Language English
Subject Keyword MATERIALS SCIENCE ♦ ALUMINIUM ALLOYS ♦ CRACKS ♦ DEFECTS ♦ ELECTRON BEAMS ♦ ELECTRON DIFFRACTION ♦ ELECTRON MICROSCOPY ♦ FAILURES ♦ FATIGUE ♦ IRRADIATION ♦ LOADING ♦ PLATES ♦ PROCESSING ♦ SILICON ♦ SILICON ALLOYS
Abstract By methods of scanning and transmission electron diffraction microscopy the analysis of structure-phase states and defect substructure of silumin subjected to high-intensity electron beam irradiation in various regimes and subsequent fatigue loading up to failure was carried out. It is revealed that the sources of fatigue microcracks are silicon plates of micron and submicron size are not soluble in electron beam processing. The possible reasons of the silumin fatigue life increase under electron-beam treatment are discussed.
ISSN 0094243X
Educational Use Research
Learning Resource Type Article
Publisher Date 2015-10-27
Publisher Place United States
Volume Number 1683
Issue Number 1


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