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Author Budiawanti, Sri ♦ Soegijono, Bambang
Source United States Department of Energy Office of Scientific and Technical Information
Content type Text
Language English
Subject Keyword MATERIALS SCIENCE ♦ CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS ♦ BARIUM COMPOUNDS ♦ DECOMPOSITION ♦ DEPOSITION ♦ ELECTRON SCANNING ♦ FERRITES ♦ MAGNETIC PROPERTIES ♦ MICROWAVE RADIATION ♦ SCANNING ELECTRON MICROSCOPY ♦ SPIN ♦ SPIN-ON COATINGS ♦ SUBSTRATES ♦ THERMAL GRAVIMETRIC ANALYSIS ♦ THIN FILMS ♦ VIBRATING SAMPLE MAGNETOMETERS ♦ X RADIATION ♦ X-RAY DIFFRACTION ♦ X-RAY DIFFRACTOMETERS
Abstract Barium hexaferrite (BaFe{sub 12}O{sub 19}, or simply known as BaM) thin films has been recognized as a potential candidate for microwave-based devices, magnetic recording media and data storage. To grow BaM thin films, chemical solution deposition is conducted using the aqueous solution of metal nitrates, which involves spin coatings on Si substrates. Furthermore, Thermal Gravimeter Analysis (TGA), X-Ray Diffractometer (XRD), Scanning Electron Microscopy (SEM) and Vibrating Sample Magnetometer (VSM) are applied to evaluate the decomposition behavior, structure, morphology, and magnetic properties of BaM thin films. Additionally, the effects of number of layers variation are also investigated. Finally, magnetic properties analysis indicates the isotropic nature of the films.
ISSN 0094243X
Educational Use Research
Learning Resource Type Article
Publisher Date 2016-04-19
Publisher Place United States
Volume Number 1729
Issue Number 1


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