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Author Tanaka, Masahiko ♦ Katsuya, Yoshio ♦ Sakata, Osami
Source United States Department of Energy Office of Scientific and Technical Information
Content type Text
Language English
Subject Keyword CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY ♦ APPROXIMATIONS ♦ BEAM OPTICS ♦ COBALT COMPOUNDS ♦ COBALT OXIDES ♦ CORRECTIONS ♦ CRYSTAL STRUCTURE ♦ CRYSTALS ♦ DIFFRACTION METHODS ♦ DISTRIBUTION ♦ FERRITES ♦ FOCUSING ♦ IRON IONS ♦ K ABSORPTION ♦ POWDERS ♦ SIGNAL-TO-NOISE RATIO ♦ SPINELS ♦ SYNCHROTRONS ♦ X RADIATION ♦ X-RAY DIFFRACTION
Abstract Focused-beam flat-sample method (FFM) is a new trial for synchrotron powder diffraction method, which is a combination of beam focusing optics, flat shape powder sample and area detectors. The method has advantages for X-ray diffraction experiments applying anomalous scattering effect (anomalous diffraction), because of 1. Absorption correction without approximation, 2. High intensity X-rays of focused incident beams and high signal noise ratio of diffracted X-rays 3. Rapid data collection with area detectors. We applied the FFM to anomalous diffraction experiments and collected synchrotron X-ray powder diffraction data of CoFe{sub 2}O{sub 4} (inverse spinel structure) using X-rays near Fe K absorption edge, which can distinguish Co and Fe by anomalous scattering effect. We conducted Rietveld analyses with the obtained powder diffraction data and successfully determined the distribution of Co and Fe ions in CoFe{sub 2}O{sub 4} crystal structure.
ISSN 0094243X
Educational Use Research
Learning Resource Type Article
Publisher Date 2016-07-27
Publisher Place United States
Volume Number 1741
Issue Number 1


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