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Author Snyder, Donald L. ♦ Thomas, Lewis J. ♦ Ter-Pogossian, Michel M.
Sponsorship IEEE Nuclear and Plasma Sciences Society ♦ Computer Applications in Nuclear and Plasma Sciences (CANPS) ♦ Lawrence Berkeley Lab. ♦ Lawrence Livermore Nat. Lab. ♦ APS ♦ College of William and Mary ♦ Continuous Electron Beam Accelerator Facility ♦ NASA ♦ Defence Nuclear Agency ♦ Sandia National Laboratories ♦ Jet Propulsion Laboratory ♦ Brookhaven Nat. Lab. ♦ Lawrence Livermore Nat. Lab ♦ IEEE/NPPS Radiat. Effects Committee ♦ Defence Nuclear Agency/DoD ♦ Sandia National Laboratories/DOE ♦ Jet Propulsion Laboratory/NASA ♦ Phillips Lab./DoD
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©1963
Language English
Subject Domain (in DDC) Natural sciences & mathematics ♦ Physics ♦ Modern physics ♦ Technology ♦ Medicine & health ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Solid scintillation detectors ♦ Time measurement ♦ Biomedical measurements ♦ Velocity measurement ♦ Scintillation counters ♦ Single photon emission computed tomography ♦ Reconstruction algorithms ♦ Electric variables measurement ♦ Positrons ♦ Signal to noise ratio
Abstract Improvements in high speed electronics and scintillation-crystal technology now permit usable differential time-of-flight measurements to be made in tomography systems that employ coincidence detection of the annihilation photons created with positron emitting radionuclides. A mathematical model for these new measurements is developed in this paper. Reconstruction algorithms and their signal-to-noise ratio performance are given.
Description Author affiliation :: Department of Electrical Engineering Biomedical Computer Laboratory, and Mallinckrodt Institute of Radiology Washington University St. Louis, Missouri 63110
ISSN 00189499
Education Level UG and PG
Learning Resource Type Article
Publisher Date 1981-06-01
Publisher Place U.S.A.
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Volume Number 28
Issue Number 3
Size (in Bytes) 2.36 MB
Page Count 9
Starting Page 3575
Ending Page 3583


Source: IEEE Xplore Digital Library