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Author Van Haste, W.
Source IEEE Xplore Digital Library
Content type Text
Publisher American Institute of Electrical Engineers
File Format PDF
Copyright Year ©2012
Language English
Subject Domain (in DDC) Natural sciences & mathematics ♦ Physics ♦ Electricity & electronics ♦ Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Electron tubes ♦ Wires ♦ Laboratories ♦ Integrated circuit reliability ♦ Transconductance ♦ Correlation
Abstract OVER the past several years the subject of reliability of electronic equipment has received considerable attention. Much has been written on the need for reliable systems, and the mathematical probabilities of component performance have been explored. While there have been demonstrations of achievement, it is felt that additional material of this nature will be of interest. One of the chief factors in establishing a reliable system is to assure compatibility of the operating environment and the capabilities of the active electronic device. This can best be brought about by close cooperation between the equipment and component designers.
Description Author affiliation :: Bell Telephone Laboratories, Inc., Allentown, Pa.
ISSN 00972452
Education Level UG and PG
Learning Resource Type Article
Publisher Date 1956-03-01
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Volume Number 75
Issue Number 1
Size (in Bytes) 1.08 MB
Page Count 5
Starting Page 50
Ending Page 54

Source: IEEE Xplore Digital Library