Thumbnail
Access Restriction
Open

Author Swamy, G. Venkat ♦ Rakshit, R. K. ♦ Basheed, G. A. ♦ Maurya, K. K. ♦ Gupta, Anurag ♦ Kumar, Dinesh ♦ Singh, Manju
Source United States Department of Energy Office of Scientific and Technical Information
Content type Text
Language English
Subject Keyword CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY ♦ ANTIFERROMAGNETISM ♦ ARGON ♦ ATOMIC FORCE MICROSCOPY ♦ CHROMIUM NITRIDES ♦ CRYSTAL STRUCTURE ♦ ELECTRIC CONDUCTIVITY ♦ FCC LATTICES ♦ LATTICE PARAMETERS ♦ MAGNESIUM OXIDES ♦ MAGNETOMETERS ♦ ORTHORHOMBIC LATTICES ♦ PARAMAGNETISM ♦ PHASE TRANSFORMATIONS ♦ SQUID DEVICES ♦ TEMPERATURE DEPENDENCE ♦ THIN FILMS ♦ VACUUM SYSTEMS ♦ X-RAY DIFFRACTION
Abstract We report the structural and electrical transport studies on CrN{sub 1-x} (CrN) thin films with varying of N{sub 2} flow (5 – 25 SCCM) in an Argon environment of 25 SCCM. CrN thin films were grown at 600°C, in a multi chamber vacuum system at working pressure of 1×10{sup −2} Torr, under the base pressure of 1×10{sup −7} Torr. Structural and electrical transport measurements were carried out using X-ray diffraction (XRD), atomic force microscopy (AFM) and SQUID magnetometer, respectively. XRD (θ-2θ, ω-2θ, and ω) patterns on CrN thin films revealed a structural phase transition which is associated with the lattice parameter variation from 4.136 to 4.168 Å. The temperature dependent resistivity measurements on CrN/MgO(001) showed a clear change in slope at ≈280 K which confirms the magneto-structural transition of CrN from paramagnetic rock salt face-centered-cubic (FCC) to antiferromagnetic orthorhombic structure.
ISSN 0094243X
Educational Use Research
Learning Resource Type Article
Publisher Date 2016-05-23
Publisher Place United States
Volume Number 1731
Issue Number 1


Open content in new tab

   Open content in new tab