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Author Van Der Aalst, Wil
Source ACM Digital Library
Content type Text
Publisher Association for Computing Machinery (ACM)
File Format PDF
Language English
Abstract Using real event data to X-ray business processes helps ensure conformance between design and reality.
Description Affiliation: Technische Universiteit Eindhoven, the Netherlands (Van Der Aalst, Wil)
Age Range 18 to 22 years ♦ above 22 year
Educational Use Research
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2005-08-01
Publisher Place New York
Journal Communications of the ACM (CACM)
Volume Number 55
Issue Number 8
Page Count 8
Starting Page 76
Ending Page 83

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Source: ACM Digital Library