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Author Ahn, Dong H. ♦ de Supinski, Bronis R. ♦ Schulz, Martin ♦ Kulkarni, Milind ♦ Qin, Feng ♦ Lee, Gregory L. ♦ Bagchi, Saurabh ♦ Gamblin, Todd ♦ Chen, Zhezhe ♦ Laguna, Ignacio ♦ Zhou, Bowen
Source ACM Digital Library
Content type Text
Publisher Association for Computing Machinery (ACM)
File Format PDF
Language English
Abstract Dynamic analysis techniques help programmers find the root cause of bugs in large-scale parallel applications.
Description Affiliation: Turn, Redwood City, CA (Zhou, Bowen) || Twitter Inc., San Francisco, CA (Chen, Zhezhe) || Lawrence Livermore National Laboratory, Livermore, CA (Laguna, Ignacio; Ahn, Dong H.; de Supinski, Bronis R.; Gamblin, Todd; Lee, Gregory L.; Schulz, Martin) || Purdue University, West Lafayette, IN (Bagchi, Saurabh; Kulkarni, Milind) || The Ohio State University, Columbus, OH (Qin, Feng)
Age Range 18 to 22 years ♦ above 22 year
Educational Use Research
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2005-08-01
Publisher Place New York
Journal Communications of the ACM (CACM)
Volume Number 58
Issue Number 9
Page Count 10
Starting Page 72
Ending Page 81

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Source: ACM Digital Library