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Author Senko, M. E.
Source ACM Digital Library
Content type Text
Publisher Association for Computing Machinery (ACM)
File Format PDF
Language English
Abstract This paper describes a section of an integrated diagnostic monitor system which facilitates the checking of sections of instructions or subroutines anywhere in the object program. A new method of specifying all diagnostic operations in a format similar to a computer program makes the system convenient to use and relatively simple to understand. The paper also describes a number of other novel diagnostic features which can be included in the system.
Description Affiliation: IBM Corp., Yorktown Heights, NY (Senko, M. E.)
Age Range 18 to 22 years ♦ above 22 year
Educational Use Research
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2005-08-01
Publisher Place New York
Journal Communications of the ACM (CACM)
Volume Number 3
Issue Number 4
Page Count 5
Starting Page 236
Ending Page 240

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Source: ACM Digital Library