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Author Valdivia, M. P. ♦ Stutman, D. ♦ Stoeckl, C. ♦ Mileham, C. ♦ Begishev, I. A. ♦ Theobald, W. ♦ Bromage, J. ♦ Regan, S. P. ♦ Klein, S. R. ♦ Muñoz-Cordovez, G. ♦ Vescovi, M. ♦ Valenzuela-Villaseca, V. ♦ Veloso, F.
Source United States Department of Energy Office of Scientific and Technical Information
Content type Text
Language English
Subject Keyword INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY ♦ PLASMA PHYSICS AND FUSION TECHNOLOGY ♦ ATTENUATION ♦ COPPER ♦ ELECTRON DENSITY ♦ ELECTRONS ♦ ENERGY DENSITY ♦ FOILS ♦ GRATINGS ♦ IMAGES ♦ INTERFEROMETERS ♦ KEV RANGE 01-10 ♦ LASERS ♦ PLASMA DENSITY ♦ PULSES ♦ REFRACTION ♦ X RADIATION
Abstract Talbot-Lau X-ray deflectometry (TXD) has been developed as an electron density diagnostic for High Energy Density (HED) plasmas. The technique can deliver x-ray refraction, attenuation, elemental composition, and scatter information from a single Moiré image. An 8 keV Talbot-Lau interferometer was deployed using laser and x-pinch backlighters. Grating survival and electron density mapping were demonstrated for 25–29 J, 8–30 ps laser pulses using copper foil targets. Moiré pattern formation and grating survival were also observed using a copper x-pinch driven at 400 kA, ∼1 kA/ns. These results demonstrate the potential of TXD as an electron density diagnostic for HED plasmas.
ISSN 00346748
Educational Use Research
Learning Resource Type Article
Publisher Date 2016-11-15
Publisher Place United States
Journal Review of Scientific Instruments
Volume Number 87
Issue Number 11


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