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Author Kflolu, Haldun ♦ Chancellor, Cathy ♦ Chen, Min ♦ Cirba, Claude ♦ Reddy, Vijay
Source ACM Digital Library
Content type Text
Publisher Association for Computing Machinery (ACM)
File Format PDF
Copyright Year ©2014
Language English
Subject Domain (in DDC) Computer science, information & general works ♦ Data processing & computer science
Subject Keyword CHC ♦ HCI ♦ MOSFET ♦ NBTI ♦ PBTI ♦ Aging ♦ Circuits ♦ Degradation ♦ Modeling ♦ Recovery
Abstract A feasible computational framework that enables improved predictability of NBTI degradation within commercially available tools is discussed. The NBTI model is used for real-time circuit operation where recovery is present. The complementary nature of implementation is readily incorporated into existing model extraction and verification tools. The method provides significantly enhanced accuracy in simulations when compared to circuit data, yet retains practicality and flexibility.
ISSN 15504832
Age Range 18 to 22 years ♦ above 22 year
Educational Use Research
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2014-01-01
Publisher Place New York
e-ISSN 15504840
Journal ACM Journal on Emerging Technologies in Computing Systems (JETC)
Volume Number 10
Issue Number 1
Page Count 16
Starting Page 1
Ending Page 16


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Source: ACM Digital Library