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Author Yasuike, K. ♦ Yamashita, T. ♦ Ochi, T. ♦ Urai, M. ♦ Miyamoto, S. ♦ Imasaki, K. ♦ Yamanaka, C. ♦ Nakai, S.
Source United States Department of Energy Office of Scientific and Technical Information
Content type Text
Language English
Subject Keyword PLASMA PHYSICS AND FUSION ♦ ICF DEVICES ♦ DIAGNOSTIC TECHNIQUES ♦ ION BEAM TARGETS ♦ CARBON IONS ♦ PROTONS ♦ KEV RANGE 100-1000 ♦ TIME RESOLUTION ♦ BEAM PROFILES
Abstract An ion beam of about 700 keV Carbon and Proton, about 20 A/cm{sup 2} {ital J}{sub {ital i}}, from an applied-B two stage diode driven by Reiden-SHVS induction adder system of 4 (2+2) MV, 160 GW, 100 ns capability, are measured by using two-dimensional APC with time resolved detector. We optimize beam uniformity by changing the magnetic field of the diode. A beam uniformity improvement is achieved at uniform-B pressure condition of diode magnetic field. Divergence in parallel and perpendicular direction are measured individually. Different dependence on This measuring system has time resolution of 10 ns, 1 mm spatial resolution on the anode of diode and about 10 mrad processed divergence resolution. {copyright} {ital 1996 American Institute of Physics.}
ISSN 0094243X
Educational Use Research
Learning Resource Type Article
Publisher Date 1996-05-01
Publisher Place United States
Volume Number 369
Issue Number 1
Technical Publication No. CONF-950476-


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