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Author Wu, HsinWei ♦ Aoki, Toshihiro ♦ Posadas, Agham B. ♦ Demkov, Alexander A. ♦ Smith, David J.
Source United States Department of Energy Office of Scientific and Technical Information
Content type Text
Language English
Subject Keyword CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS ♦ FILMS ♦ IMAGES ♦ INTERFACES ♦ LAYERS ♦ NUCLEATION ♦ RESOLUTION ♦ STRONTIUM TITANATES ♦ SURFACES ♦ TITANIUM OXIDES ♦ TRANSMISSION ELECTRON MICROSCOPY
Abstract In this work, the atomic structure of anti-phase boundary defects at the SrTiO{sub 3}/Si (001) interface is investigated by aberration-corrected scanning transmission electron microscopy. Atomic-resolution images reveal an abrupt SrTiO{sub 3}/Si interface with no intermediate oxide layer. Both single and double Si atomic columns (“dumbbells”) from different terraces of the Si(001) surface are visible at the interface. Anti-phase boundaries (APB) consisting of two adjacent TiO{sub 2} planes in the SrTiO{sub 3} (STO) film resulting either from Si surface steps or from the merging of crystalline domains from different surface nucleation sites are identified. These APBs occur on either {110} or {010} planes and both types have displacement vectors of a{sub STO}/2⟨110⟩.
ISSN 00036951
Educational Use Research
Learning Resource Type Article
Publisher Date 2016-02-29
Publisher Place United States
Journal Applied Physics Letters
Volume Number 108
Issue Number 9


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