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Author van de Goor, A. J. ♦ Verruijt, C. A.
Source ACM Digital Library
Content type Text
Publisher Association for Computing Machinery (ACM)
File Format PDF
Copyright Year ©1990
Language English
Subject Domain (in DDC) Computer science, information & general works ♦ Data processing & computer science
Abstract This paper presents an overview of deterministic functional RAM chip testing. Instead of the traditional ad-hoc approach toward developing memory test algorithms, a hierarchy of functional faults and tests is presented, which is shown to cover all likely functional memory faults. This is done by presenting a novel way of categorizing the faults. All (possible) fault combinations are discussed. Requirements are put forward under which conditions a fault combination can be detected. Finally, memory test algorithms that satisfy the given requirements are presented.
ISSN 03600300
Age Range 18 to 22 years ♦ above 22 year
Educational Use Research
Education Level UG and PG
Learning Resource Type Article
Publisher Date 1990-03-01
Publisher Place New York
e-ISSN 15577341
Journal ACM Computing Surveys (CSUR)
Volume Number 22
Issue Number 1
Page Count 29
Starting Page 5
Ending Page 33


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Source: ACM Digital Library