|Source||CERN Document Server|
|Subject Domain (in DDC)||Natural sciences & mathematics ♦ Physics ♦ Modern physics ♦ Technology ♦ Engineering & allied operations ♦ Applied physics|
|Abstract||1.1 This practice establishes the minimum requirements for radiological examination for metallic and nonmetallic material using a digital detector array (DDA) system. 1.2 The requirements in this practice are intended to control the quality of radiologic images and are not intended to establish acceptance criteria for parts or materials. 1.3 This practice covers the radiologic examination with DDAs including DDAs described in Practice E2597 such as a device that contains a photoconductor attached to a Thin Film Transistor (TFT) read out structure, a device that has a phosphor coupled directly to an amorphous silicon read-out structure, and devices where a phosphor is coupled to a CMOS (Complementary metal–oxide–semiconductor) array, a Linear Detector Array (LDA) or a CCD (charge coupled device) crystalline silicon read-out structure. 1.4 The DDA shall be selected for an NDT application based on knowledge of the technology described in Guide , and of the selected DDA properties provided by the manufacturer in accordance with Practice E2597. 1.5 The requirements of this practice and Practice shall be used together and both be approved by the CEO Level 3 in Radiography before inspection of production hardware. The requirements of Practice will provide the baseline evaluation and long term stability test procedures for the DDA system. 1.6 The requirements in this practice shall be used when placing a DDA into NDT service and, before being placed into service, an established baseline of system qualification shall be performed in accordance with Practice . 1.7 Techniques and applications employed with DDAs are diverse. This practice is not intended to be limiting or restrictive. Refer to Guides E94, E1000, , Terminology E1316, Practice E747 and E1025, Fed. Std. Nos. 21CFR 1020.40 and 29 CFR 1910.96 for a list of documents that provide additional information and guidance.|
|Learning Resource Type||Standard|
|Publisher Place||West Conshohocken, PA|
|Organization||American Society for Testing and Materials. Philadelphia|
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