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Author Mahajan, S. V. ♦ Upadhye, D. S. ♦ Bagul, S. B. ♦ Shaikh, S. U. ♦ Birajadar, R. B. ♦ Siddiqui, F. Y. ♦ Huse, N. P. ♦ Sharma, R. B.
Source United States Department of Energy Office of Scientific and Technical Information
Content type Text
Language English
Subject Keyword CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY ♦ ADSORPTION ♦ CUBIC LATTICES ♦ ELECTRIC CONDUCTIVITY ♦ ENERGY GAP ♦ IRRADIATION ♦ LAYERS ♦ MEV RANGE ♦ MULTICHARGED IONS ♦ NANOSTRUCTURES ♦ NICKEL IONS ♦ OPTICAL PROPERTIES ♦ POLYCRYSTALS ♦ SENSORS ♦ SPECTROPHOTOMETRY ♦ THIN FILMS ♦ VISIBLE RADIATION ♦ X-RAY DIFFRACTION ♦ ZINC OXIDES
Abstract Nanocrystalline Zinc Oxide (ZnO) thin film prepared by Low cost Successive Ionic Layer Adsorption and Reaction (SILAR) method. This film was irradiated by 120 MeV Ni{sup 7+} ions with the fluence of 5x10{sup 12}ions/cm{sup 2}. The X-ray diffraction study was shows polycrystalline nature with wurtzite structure. The optical properties as absorbance were determined using UV-Spectrophotometer and band gap was also calculated. The Photo Sensor nature was calculated by I-V characteristics with different sources of light 40W, 60W and 100W.
ISSN 0094243X
Educational Use Research
Learning Resource Type Article
Publisher Date 2015-06-24
Publisher Place United States
Volume Number 1665
Issue Number 1


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