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Author Marullo-Reedtz, G. ♦ Cerri, R. ♦ Blanc, I. ♦ Gunnarsson, O. ♦ Williams, J. ♦ Raso, F. ♦ Kyu-Tae Kim ♦ Frenkel, R.B. ♦ Zhang Xiuzeng ♦ Katkov, A.S. ♦ Dziuba, R. ♦ Parker, M. ♦ Wood, B.M. ♦ Christian, L.A. ♦ Tarnow, E. ♦ Mahajan, S.K. ♦ Singh, A. ♦ Sakamoto, Y.
Sponsorship IEEE Instrumentation and Measurement Society ♦ IEEE Instrumentation and Measurement Society ♦ Bureau international des poids et mesures ♦ IEEE ♦ International Bureau of Weights and Measures (BIPM) ♦ URSI ♦ NBS ♦ Agency Ind. Sci. & Technol., Min. Int. Trade & Ind. ♦ Sci. Council Japan ♦ International Union of Pure and Applied Physics (IUPAP) ♦ Bureau international des poids et mesures ♦ NIST ♦ NRCC ♦ National Conference of Standards Laboratories (NCSL) ♦ Allen Osborne Associates ♦ Andeen-Hagerling, Inc. ♦ Ballantine Lab. Inc. ♦ Clarke-Hess Communications Research Corp. ♦ Fluke Corporation ♦ Guildline Instruments ♦ Hewlett-Packard Co. ♦ Julie Res. Lab. Inc. ♦ Keithley Instruments, Inc. ♦ Measurements International Ltd. Canada ♦ QuadTech Inc. ♦ Quantum Design Inc. ♦ Rotek Instrum. Corp. ♦ Tegam Inc. ♦ Tektronix Inc
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©1963
Language English
Subject Domain (in DDC) Natural sciences & mathematics ♦ Physics ♦ Electricity & electronics
Subject Keyword Metrology ♦ Laboratories ♦ Resistors ♦ NIST ♦ Measurement standards ♦ Instruments ♦ Voltage measurement ♦ Testing ♦ Australia
Abstract Fifteen National Metrology Institutes have participated in DC voltage ratio comparison CCEM-K8. The method followed to normalize the participants' results, the calculation of the key comparison reference values and the comparison results are reported for the two mandatory ratios of the comparison, 1000 V/10 V and 100 V/10 V.
Description Author affiliation :: Inst. Elettrotecnico Nazionale G. Ferraris, Torino, Italy
ISSN 00189456
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2003-04-01
Publisher Place U.S.A.
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Volume Number 52
Issue Number 2
Size (in Bytes) 392.80 kB
Page Count 5
Starting Page 419
Ending Page 423


Source: IEEE Xplore Digital Library