|Author||Agrawal, A. K. ♦ Singh, B. ♦ Kashyap, Y. S. ♦ Shukla, Mayank ♦ Sarkar, P. S. ♦ Sinha, Amar|
|Source||United States Department of Energy Office of Scientific and Technical Information|
|Subject Keyword||CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY ♦ ABSORPTION ♦ DENSITY ♦ DIFFRACTION ♦ INDUS-2 ♦ INTERFACES ♦ THICKNESS ♦ VARIATIONS ♦ VISIBILITY ♦ X RADIATION|
|Abstract||Conventional X-ray imaging based on absorption contrast permits limited visibility of feature having small density and thickness variations. For imaging of weakly absorbing material or materials possessing similar densities, a novel phase contrast imaging techniques called diffraction enhanced imaging has been designed and developed at imaging beamline Indus-2 RRCAT Indore. The technique provides improved visibility of the interfaces and show high contrast in the image forsmall density or thickness gradients in the bulk. This paper presents basic principle, instrumentation and analysis methods for this technique. Initial results of quantitative phase retrieval carried out on various samples have also been presented.|
|Learning Resource Type||Article|
|Publisher Place||United States|
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