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Author Diener, J. ♦ Kunzner, N. ♦ Kovalev, D. ♦ Gross, E. ♦ Timoshenko, V. Yu. ♦ Polisski, G. ♦ Koch, F.
Sponsorship (US)
Source United States Department of Energy Office of Scientific and Technical Information
Content type Text
Publisher The American Physical Society
Language English
Subject Keyword CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS ♦ ANISOTROPY ♦ BIREFRINGENCE ♦ PHYSICS ♦ POLARIZATION ♦ REFLECTION ♦ REFRACTIVE INDEX ♦ SILICON
Abstract Multilayers of anisotropically nanostructured silicon (Si) have been fabricated and studied by polarization-resolved reflection measurements. Alternating layers having different refractive indices exhibit additionally a strong in-plane anisotropy of their refractive index (birefringence). Therefore, a stack of layers, acting as a distributed Bragg reflector, has two distinct reflection bands, depending on the polarization of the incident linearly polarized light. This effect is governed by a three-dimensional (in-plane and in-depth) variation of the refractive index. These structures can yield optical effects which are difficult to achieve with conventional Bragg reflectors. {copyright} 2001 American Institute of Physics.
ISSN 00036951
Educational Use Research
Learning Resource Type Article
Publisher Date 2001-06-11
Publisher Place United States
Journal Applied Physics Letters
Volume Number 78
Issue Number 24


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